{"id":11632,"date":"2023-10-31T03:35:36","date_gmt":"2023-10-30T18:35:36","guid":{"rendered":"http:\/\/jfs.or.jp\/bunken-search\/2023\/10\/31\/xi%ef%bc%8e%ef%bd%93%ef%bd%85%ef%bd%8d-%ef%bd%85%ef%bd%82%ef%bd%93%ef%bd%90%e6%b3%95%e3%81%a8%e3%81%9d%e3%81%ae%e9%8b%b3%e9%80%a0%e7%b5%84%e7%b9%94%e8%a7%a3%e6%9e%90%e3%81%b8%e3%81%ae%e9%81%a9\/"},"modified":"2023-10-31T03:35:36","modified_gmt":"2023-10-30T18:35:36","slug":"xi%ef%bc%8e%ef%bd%93%ef%bd%85%ef%bd%8d-%ef%bd%85%ef%bd%82%ef%bd%93%ef%bd%90%e6%b3%95%e3%81%a8%e3%81%9d%e3%81%ae%e9%8b%b3%e9%80%a0%e7%b5%84%e7%b9%94%e8%a7%a3%e6%9e%90%e3%81%b8%e3%81%ae%e9%81%a9","status":"publish","type":"post","link":"http:\/\/jfs.or.jp\/bunken-search\/2023\/10\/31\/xi%ef%bc%8e%ef%bd%93%ef%bd%85%ef%bd%8d-%ef%bd%85%ef%bd%82%ef%bd%93%ef%bd%90%e6%b3%95%e3%81%a8%e3%81%9d%e3%81%ae%e9%8b%b3%e9%80%a0%e7%b5%84%e7%b9%94%e8%a7%a3%e6%9e%90%e3%81%b8%e3%81%ae%e9%81%a9\/","title":{"rendered":"XI\uff0e\uff33\uff25\uff2d-\uff25\uff22\uff33\uff30\u6cd5\u3068\u305d\u306e\u92f3\u9020\u7d44\u7e54\u89e3\u6790\u3078\u306e\u9069\u7528"},"content":{"rendered":"<p>XI\uff0e\uff33\uff25\uff2d-\uff25\uff22\uff33\uff30\u6cd5\u3068\u305d\u306e\u92f3\u9020\u7d44\u7e54\u89e3\u6790\u3078\u306e\u9069\u7528\u9023\u8f09\u8b1b\u5ea7\u30fb\u8b1b\u7fa9[S]200402XI\uff0e\uff33\uff25\uff2d-\uff25\uff22\uff33\uff30\u6cd5\u3068\u305d\u306e\u92f3\u9020\u7d44\u7e54\u89e3\u6790\u3078\u306e\u9069\u7528Practical Application of SEM-EBSP Analysis for Cast Materials\u6885\u6fa4\u4fee(\u6a2a\u6d5c\u56fd\u7acb\u5927\u5b66)XI\uff0eSEM-EBSP\u6cd5\u3068\u305d\u306e\u92f3\u9020\u7d44\u7e54\u89e3\u6790\u3078\u306e\u9069\u7528 , Practical Application of SEM-EBSP Analysis for Cast Materials, XI\uff0eSEM-EBSP\u6cd5\u3068\u305d\u306e\u92f3\u9020\u7d44\u7e54\u89e3\u6790\u3078\u306e\u9069\u7528, electron backscatter diffraction, solidification microstructure, micortexture, scanning electron microscopy, crystal orientationVol.76-0163\u9023\u8f09\u8b1b\u5ea7\u30fb\u8b1b\u7fa9[S]n11424<\/p>\n","protected":false},"excerpt":{"rendered":"<p>XI\uff0e\uff33\uff25\uff2d-\uff25\uff22\uff33\uff30\u6cd5\u3068\u305d\u306e\u92f3\u9020\u7d44\u7e54\u89e3\u6790\u3078\u306e\u9069\u7528\u9023\u8f09\u8b1b\u5ea7\u30fb\u8b1b\u7fa9[S]200402XI\uff0e\uff33\uff25\uff2d-\uff25\uff22\uff33\uff30\u6cd5\u3068\u305d\u306e\u92f3\u9020\u7d44\u7e54\u89e3\u6790\u3078\u306e\u9069\u7528Practical Application of SEM-EBSP Analysis f [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"vkexunit_cta_each_option":"","footnotes":""},"categories":[1],"tags":[],"bunrui":[7],"class_list":["post-11632","post","type-post","status-publish","format-standard","hentry","category-bunken","bunrui-s"],"acf":[],"_links":{"self":[{"href":"http:\/\/jfs.or.jp\/bunken-search\/wp-json\/wp\/v2\/posts\/11632","targetHints":{"allow":["GET"]}}],"collection":[{"href":"http:\/\/jfs.or.jp\/bunken-search\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"http:\/\/jfs.or.jp\/bunken-search\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"http:\/\/jfs.or.jp\/bunken-search\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"http:\/\/jfs.or.jp\/bunken-search\/wp-json\/wp\/v2\/comments?post=11632"}],"version-history":[{"count":0,"href":"http:\/\/jfs.or.jp\/bunken-search\/wp-json\/wp\/v2\/posts\/11632\/revisions"}],"wp:attachment":[{"href":"http:\/\/jfs.or.jp\/bunken-search\/wp-json\/wp\/v2\/media?parent=11632"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"http:\/\/jfs.or.jp\/bunken-search\/wp-json\/wp\/v2\/categories?post=11632"},{"taxonomy":"post_tag","embeddable":true,"href":"http:\/\/jfs.or.jp\/bunken-search\/wp-json\/wp\/v2\/tags?post=11632"},{"taxonomy":"bunrui","embeddable":true,"href":"http:\/\/jfs.or.jp\/bunken-search\/wp-json\/wp\/v2\/bunrui?post=11632"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}