Reduction of Gas Amount and Defects by Vacuum Effect Simulation in High Pressure Die-Casting

Reduction of Gas Amount and Defects by Vacuum Effect Simulation in High Pressure Die-Casting講演概要・記念講演[M]10.11279/jfeskouen.166_30201505Reduction of Gas Amount and Defects by Vacuum Effect Simulation in High Pressure Die-CastingSung-Bin KIM・Young-Hoon YIM・Se-Ho AHN・Sung-Min MOON(AnyCasting Co.Ltd)Reduction of Gas Amount and Defects by Vacuum Effect Simulation in High Pressure Die-Casting0166-0030講演概要・記念講演[M]n21792

分類講演概要・記念講演[M]
DOI10.11279/jfeskouen.166_30
掲載年月201505
論文名Reduction of Gas Amount and Defects by Vacuum Effect Simulation in High Pressure Die-Casting
論文名(英)
研究者Sung-Bin KIM・Young-Hoon YIM・Se-Ho AHN・Sung-Min MOON(AnyCasting Co.Ltd)
キーワードReduction of Gas Amount and Defects by Vacuum Effect Simulation in High Pressure Die-Casting
掲載ページ0166-0030
IDn21792